Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Microelectronics, Volume. 52, Issue 6, 1076(2022)

Study on Total Ionizing Dose Effect of 22 nm Bulk Silicon nFinFET

CUI Xu1...2,3, CUI Jiangwei1,2,3, ZHENG Qiwen1,2,3, WEI Ying1,2,3, LI Yudong1,2,3, and GUO Qi1,23 |Show fewer author(s)
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (16)
    Tools
    Paper Information
    Topics
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    CUI Xu, CUI Jiangwei, ZHENG Qiwen, WEI Ying, LI Yudong, GUO Qi. Study on Total Ionizing Dose Effect of 22 nm Bulk Silicon nFinFET[J]. Microelectronics, 2022, 52(6): 1076

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category:

    Received: Nov. 30, 2021

    Accepted: --

    Published Online: Mar. 11, 2023

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.210465

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology