Infrared and Laser Engineering, Volume. 49, Issue 4, 0404004(2020)

Research on testing technology of column-level ADC in IRFPA digital readout circuits

Yiqun Cen1...2, Junling Zhang1, Honglei Chen1 and Ruijun Ding1 |Show fewer author(s)
Author Affiliations
  • 1Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    References(16)

    [1] T Markovitz, I Shtrichman. Megapixel digital InSb detector for mid-wave infrared imaging. Optical Engineering, 50, 409-421(2011).

    [3] I Kenneth, W Michael, J Justin. Digital-pixel focal plane array technology. Lincoln Laboratory Journal, 20, 36-51(2014).

    [5] 高磊, Lei Gao, 翟永成, Yongcheng Zhai, 梁清华, Qinghua Liang. IRFPA ROIC integrated digital output. Infrared and Laser Engineering, 44, 1686-1691(2015).

    [6] 白丕绩, Piji Bai, 赵俊, Jun Zhao, 韩福忠, Fuzhong Han. Review of digital mid-wave infrared focal plane array detector assembly. Infrared and Laser Engineering, 46, 0102003(2017).

    [7] [7] Yang S, Luo L, Lu W, et al. A 16bit twostep pixellevel ADC f 384288 infrared focal plane array [C]2017 IEEE 12th International Conference on ASIC (ASICON). IEEE, 2017.

    [9] [9] Reibel Y, Rubaldo L, Bonnouvrier G, et al. Latest developments in advanced MCT infrared cooled detects [C]Proceedings of SPIE, 2011, 8185(4): 818503.

    [13] [13] Maxim Integrated, Histogram Testing Determines DNL INL Errs[EBOL].[20030618].https:www.maximintegrated.comenappnotesindex.mvpid2085

    [15] [15] Rebai C, Dallet D, Marchegay P. Non coherent spectral analysis of ADC using filter bank[C]Instrumentation Measurement Technology Conference, 2002.

    [16] [16] Engineer A D I. Data Conversion Hbook Analog Devices Inc[Z]. Data Conversion Hbook. 2013.

    [17] 戴澜, Lan Dan, 姜岩峰, Yanfeng Jiang, 刘文楷, Wenkai Liu. Testing research based on Matlab for high-speed and high-resolution ADC. Computer Measurement & Control, 18, 2044-2045,2049(2010).

    [18] [18] Fexa P, Vedral J. Developing automated data acquisition system f ADC DAC testing[C]Intelligent Data Acquisition Advanced Computing Systems (IDAACS), 2011 IEEE 6th International Conference on, 2011.

    CLP Journals

    [1] Shuang Wu, Jianyi Zhang, Honglei Chen, Ruijun Ding. Adaptive-gain infrared focal plane array readout circuit with anti-fold CDS[J]. Infrared and Laser Engineering, 2024, 53(5): 20230688

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    Yiqun Cen, Junling Zhang, Honglei Chen, Ruijun Ding. Research on testing technology of column-level ADC in IRFPA digital readout circuits[J]. Infrared and Laser Engineering, 2020, 49(4): 0404004

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    Paper Information

    Received: Dec. 20, 2019

    Accepted: --

    Published Online: May. 27, 2020

    The Author Email:

    DOI:10.3788/IRLA202049.0404004

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