Infrared and Laser Engineering, Volume. 49, Issue 4, 0404004(2020)

Research on testing technology of column-level ADC in IRFPA digital readout circuits

Yiqun Cen1,2, Junling Zhang1, Honglei Chen1, and Ruijun Ding1
Author Affiliations
  • 1Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    [6] 白丕绩, Piji Bai, 赵俊, Jun Zhao, 韩福忠, Fuzhong Han. Review of digital mid-wave infrared focal plane array detector assembly. Infrared and Laser Engineering, 46, 0102003(2017).

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    [17] 戴澜, Lan Dan, 姜岩峰, Yanfeng Jiang, 刘文楷, Wenkai Liu. Testing research based on Matlab for high-speed and high-resolution ADC. Computer Measurement & Control, 18, 2044-2045,2049(2010).

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    Yiqun Cen, Junling Zhang, Honglei Chen, Ruijun Ding. Research on testing technology of column-level ADC in IRFPA digital readout circuits[J]. Infrared and Laser Engineering, 2020, 49(4): 0404004

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    Paper Information

    Received: Dec. 20, 2019

    Accepted: --

    Published Online: May. 27, 2020

    The Author Email:

    DOI:10.3788/IRLA202049.0404004

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