Infrared and Laser Engineering, Volume. 49, Issue 4, 0404004(2020)
Research on testing technology of column-level ADC in IRFPA digital readout circuits
[1] T Markovitz, I Shtrichman. Megapixel digital InSb detector for mid-wave infrared imaging. Optical Engineering, 50, 409-421(2011).
[3] I Kenneth, W Michael, J Justin. Digital-pixel focal plane array technology. Lincoln Laboratory Journal, 20, 36-51(2014).
[5] 高磊, Lei Gao, 翟永成, Yongcheng Zhai, 梁清华, Qinghua Liang. IRFPA ROIC integrated digital output. Infrared and Laser Engineering, 44, 1686-1691(2015).
[6] 白丕绩, Piji Bai, 赵俊, Jun Zhao, 韩福忠, Fuzhong Han. Review of digital mid-wave infrared focal plane array detector assembly. Infrared and Laser Engineering, 46, 0102003(2017).
[7] [7] Yang S, Luo L, Lu W, et al. A 16bit twostep pixellevel ADC f 384288 infrared focal plane array [C]2017 IEEE 12th International Conference on ASIC (ASICON). IEEE, 2017.
[9] [9] Reibel Y, Rubaldo L, Bonnouvrier G, et al. Latest developments in advanced MCT infrared cooled detects [C]Proceedings of SPIE, 2011, 8185(4): 818503.
[13] [13] Maxim Integrated, Histogram Testing Determines DNL INL Errs[EBOL].[20030618].https:www.maximintegrated.comenappnotesindex.mvpid2085
[15] [15] Rebai C, Dallet D, Marchegay P. Non coherent spectral analysis of ADC using filter bank[C]Instrumentation Measurement Technology Conference, 2002.
[16] [16] Engineer A D I. Data Conversion Hbook Analog Devices Inc[Z]. Data Conversion Hbook. 2013.
[17] 戴澜, Lan Dan, 姜岩峰, Yanfeng Jiang, 刘文楷, Wenkai Liu. Testing research based on Matlab for high-speed and high-resolution ADC. Computer Measurement & Control, 18, 2044-2045,2049(2010).
[18] [18] Fexa P, Vedral J. Developing automated data acquisition system f ADC DAC testing[C]Intelligent Data Acquisition Advanced Computing Systems (IDAACS), 2011 IEEE 6th International Conference on, 2011.
Get Citation
Copy Citation Text
Yiqun Cen, Junling Zhang, Honglei Chen, Ruijun Ding. Research on testing technology of column-level ADC in IRFPA digital readout circuits[J]. Infrared and Laser Engineering, 2020, 49(4): 0404004
Received: Dec. 20, 2019
Accepted: --
Published Online: May. 27, 2020
The Author Email: