Infrared and Laser Engineering, Volume. 49, Issue 4, 0404004(2020)
Research on testing technology of column-level ADC in IRFPA digital readout circuits
Fig. 1. Architecture of digital readout circuits with column-level ADC
Fig. 6. Front panel of Labview (data acquisition module and display module)
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Yiqun Cen, Junling Zhang, Honglei Chen, Ruijun Ding. Research on testing technology of column-level ADC in IRFPA digital readout circuits[J]. Infrared and Laser Engineering, 2020, 49(4): 0404004
Received: Dec. 20, 2019
Accepted: --
Published Online: May. 27, 2020
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