Infrared and Laser Engineering, Volume. 49, Issue 4, 0404004(2020)

Research on testing technology of column-level ADC in IRFPA digital readout circuits

Yiqun Cen1...2, Junling Zhang1, Honglei Chen1 and Ruijun Ding1 |Show fewer author(s)
Author Affiliations
  • 1Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(9)
    Architecture of digital readout circuits with column-level ADC
    ADC static performance DNL, INL and missing code
    Distribution of output codes at Vin=1.039 V
    Schematic block diagram of the testing system
    Front panel of Labview( parameter setting module)
    Front panel of Labview (data acquisition module and display module)
    DNL and INL curves
    Time domain diagram of digital outputs
    Frequency domain diagram of digital outputs
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    Yiqun Cen, Junling Zhang, Honglei Chen, Ruijun Ding. Research on testing technology of column-level ADC in IRFPA digital readout circuits[J]. Infrared and Laser Engineering, 2020, 49(4): 0404004

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    Paper Information

    Received: Dec. 20, 2019

    Accepted: --

    Published Online: May. 27, 2020

    The Author Email:

    DOI:10.3788/IRLA202049.0404004

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