Evaluating electron induced degradation of triple-junction solar cell by numerical simulation

Jun-wei LI; Zu-jun WANG; Cheng-ying SHI; Yuan-yuan XUE; Hao NING; Rui XU

doi:10.1007/s11801-021-0107-5

Optoelectronics Letters, Volume. 17, Issue 5, 276(2021)

Evaluating electron induced degradation of triple-junction solar cell by numerical simulation

Jun-wei LI¹, Zu-jun WANG^2、*, Cheng-ying SHI¹, Yuan-yuan XUE², Hao NING³, and Rui XU³

Author Affiliations

¹Xi’an Research Institute of High-Technology, Xi’an 710025, China

²Northwest Institute of Nuclear Technology, Xi’an 710024, China

³School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, China

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LI Jun-wei, WANG Zu-jun, SHI Cheng-ying, XUE Yuan-yuan, NING Hao, XU Rui. Evaluating electron induced degradation of triple-junction solar cell by numerical simulation[J]. Optoelectronics Letters, 2021, 17(5): 276

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Paper Information

Received: Jun. 24, 2020

Accepted: Jul. 23, 2020

Published Online: Sep. 2, 2021

The Author Email: Zu-jun WANG (wangzujun@nint.ac.cn)

DOI:10.1007/s11801-021-0107-5

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