Acta Optica Sinica, Volume. 34, Issue 10, 1031002(2014)

Properties of Iridium Thin Films Fabricated by Atomic Layer Deposition

Ye Zhijie*, Shen Weidong, Zhang Yueguang, Zhang Xing, Yuan Wenjia, Li Yanghui, and Liu Xu
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    CLP Journals

    [1] Lin Lai, Yanghui Li, Hui Zhou, Haosheng Xia, Xiaoyu Liu, Chengliang Xia, Le Wang. Study of Film Uniformity on Large-Curvature Substrate Surface Based on Atomic Layer Deposition[J]. Laser & Optoelectronics Progress, 2018, 55(3): 033101

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    Ye Zhijie, Shen Weidong, Zhang Yueguang, Zhang Xing, Yuan Wenjia, Li Yanghui, Liu Xu. Properties of Iridium Thin Films Fabricated by Atomic Layer Deposition[J]. Acta Optica Sinica, 2014, 34(10): 1031002

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    Paper Information

    Category: Thin Films

    Received: May. 12, 2014

    Accepted: --

    Published Online: Sep. 9, 2014

    The Author Email: Zhijie Ye (yezhijie006@163.com)

    DOI:10.3788/aos201434.1031002

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