Electronics Optics & Control, Volume. 29, Issue 4, 106(2022)

PCB Defect Detection Based on Improved YOLO v3

LI Wen... LI Xiaochun and YAN Haolei |Show fewer author(s)
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    References(13)

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    LI Wen, LI Xiaochun, YAN Haolei. PCB Defect Detection Based on Improved YOLO v3[J]. Electronics Optics & Control, 2022, 29(4): 106

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    Paper Information

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    Received: Apr. 15, 2021

    Accepted: --

    Published Online: Apr. 22, 2022

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2022.04.020

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