Electronics Optics & Control, Volume. 29, Issue 4, 106(2022)
PCB Defect Detection Based on Improved YOLO v3
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LI Wen, LI Xiaochun, YAN Haolei. PCB Defect Detection Based on Improved YOLO v3[J]. Electronics Optics & Control, 2022, 29(4): 106
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Received: Apr. 15, 2021
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Published Online: Apr. 22, 2022
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