Optics and Precision Engineering, Volume. 24, Issue 12, 3020(2016)
Measurement of bulk defects for KDP crystal billet with focused line scanning
[1] [1] BAISDEN P A, ATHERTON L J, HAWLEY R A, et al.. Large optics for the national ignition facility [J]. Fusion Science and Technology, 2016, 69:295-351.
[2] [2] CAMPBELL J H,HAWLEY-FEDDER R A, STOLZ C J, et al.. NIF optical materials and fabrication technologies: An overview [J]. Proc. of SPIE, 2004, 5341: 84-101.
[3] [3] YU J X, XIANG X, HE S B, et al.. Laser-induced damage initiation and growth of optical materials [J]. Advances in Condensed Matter Physics, 2014, 2014: 1-10.
[4] [4] PAN Y X, ZHANG H C, LI M M, et al.. Effect of focus position of ns pulse laser on damage characteristics of K9 glass [J]. Proc. of SPIE, 2015, 9543: 95430O-1-7.
[5] [5] LIAO Z M, RAYMOND B, GAYLORD J, et al.. Damage modeling and statistical analysis of optics damage performance in MJ-class laser [J]. Optics Express, 2014, 22(23): 28845-28856.
[6] [6] CHANG J X, ZHAO Y A, HU G H, et al.. Characterization of inclusions in KD2PO4 crystals [J]. Chinese Optics Letters, 2015, 13(8): 081601-1-4.
[7] [7] GB/T 7962.8——2010, Test methods of colourless optical glass Part 8: Bubble [S]. (in Chinese)
[8] [8] WOLF J, RUNKEL M. System for detection of small inclusions in large optics [J]. Proc. of SPIE, 2008, 7132:71320W-1-8.
[9] [9] DEMOS S G, STAGGS M, RADOUSKY H B. Bulk defect formations in KH2PO4 crystals investigated using fluorescence microscopy [J]. Physical Review B, 2003, 67:224102-1-6.
[10] [10] DEMOS S G, STAGGS M, YAN M, et al.. Microscopic fluorescence imaging of bulk defect clusters in KH2PO4 crystals [J]. Optics Letters, 1999, 24(4): 268-270.
[11] [11] COX A J, DEWEERD A J, JENNIFER L. An experiment to measure Mie and Rayleigh total scattering cross sections [J]. Am. J. Phys., 2002, 70(6): 620-625.
[12] [12] ZHANG B, KONG F Y, WU Z L, et al.. Investigation on optical surface defect extraction algorithm based on background correction and image segmentation method [J]. Proc. of SPIE, 2015, 9532:95322D-1-7.
Get Citation
Copy Citation Text
NI Kai-zao, LIU Shi-jie, WU Zhou-ling, CHEN Jian. Measurement of bulk defects for KDP crystal billet with focused line scanning[J]. Optics and Precision Engineering, 2016, 24(12): 3020
Category:
Received: Oct. 18, 2016
Accepted: --
Published Online: Jan. 23, 2017
The Author Email: Kai-zao NI (nikaizao@siom.ac.cn)