Optics and Precision Engineering, Volume. 24, Issue 12, 3020(2016)
Measurement of bulk defects for KDP crystal billet with focused line scanning
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NI Kai-zao, LIU Shi-jie, WU Zhou-ling, CHEN Jian. Measurement of bulk defects for KDP crystal billet with focused line scanning[J]. Optics and Precision Engineering, 2016, 24(12): 3020
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Received: Oct. 18, 2016
Accepted: --
Published Online: Jan. 23, 2017
The Author Email: Kai-zao NI (nikaizao@siom.ac.cn)
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