Study On Optical Communications, Volume. 46, Issue 2, 50(2020)

A Method for Measuring the Thickness of Dielectric Thin Films on the Inner Wall of a Cylindrical Cavity

ZHANG Shu-e and YU Xing-yuan*
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    References(3)

    [6] [6] Dupont J, Mignot G, Zboray R,et al.Infrared Film Thickness Measurement:Comparison with Cold Neutron Imaging[J]. Journal of Nuclear Science and Technology, 2016, 53(5): 673-681.

    [7] [7] Lubnow M, Jeffries J B, Dreier T,et al.Water Film Thickness Imaging based on Time-multiplexed Near-infrared Absorption[J].Optics Express,2018,26(16):20902-20912

    [11] [11] Ju P, Yang X H, Schlegel J P, et al. Average Liquid Film Thickness of Annular Air-water Two-phase Flow in 8×8 Rod Bundle[J].International Journal of Heat and Fluid Flow,2018(73):63-73.

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    ZHANG Shu-e, YU Xing-yuan. A Method for Measuring the Thickness of Dielectric Thin Films on the Inner Wall of a Cylindrical Cavity[J]. Study On Optical Communications, 2020, 46(2): 50

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    Paper Information

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    Received: Jul. 5, 2019

    Accepted: --

    Published Online: Nov. 11, 2020

    The Author Email: Xing-yuan YU (yuxingyuan319@163.com)

    DOI:10.13756/j.gtxyj.2020.02.011

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