Study On Optical Communications, Volume. 46, Issue 2, 50(2020)
A Method for Measuring the Thickness of Dielectric Thin Films on the Inner Wall of a Cylindrical Cavity
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ZHANG Shu-e, YU Xing-yuan. A Method for Measuring the Thickness of Dielectric Thin Films on the Inner Wall of a Cylindrical Cavity[J]. Study On Optical Communications, 2020, 46(2): 50
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Received: Jul. 5, 2019
Accepted: --
Published Online: Nov. 11, 2020
The Author Email: Xing-yuan YU (yuxingyuan319@163.com)
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