Progress of Point Scanning Super-Resolution Microscopy Based on Frequency Shifting

Yuchen Chen; Chuankang Li; Xiang Hao; Cuifang Kuang; Xu Liu

doi:10.3788/LOP57.180001

Laser & Optoelectronics Progress, Volume. 57, Issue 18, 180001(2020)

Progress of Point Scanning Super-Resolution Microscopy Based on Frequency Shifting

Yuchen Chen¹, Chuankang Li¹, Xiang Hao¹, Cuifang Kuang^1,2,3、*, and Xu Liu^1,2

¹State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, Zhejiang 310027, China

²Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan, Shanxi 0 30006, China

³Ningbo Research Institute, Zhejiang University, Ningbo, Zhejiang 315100, China

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Yuchen Chen, Chuankang Li, Xiang Hao, Cuifang Kuang, Xu Liu. Progress of Point Scanning Super-Resolution Microscopy Based on Frequency Shifting[J]. Laser & Optoelectronics Progress, 2020, 57(18): 180001

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Paper Information

Category: Reviews

Received: Apr. 27, 2020

Accepted: Jun. 4, 2020

Published Online: Sep. 2, 2020

The Author Email: Kuang Cuifang (cfkuang@zju.edu.cn)

DOI:10.3788/LOP57.180001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology