New speckle pattern interferometry for precise <i>in situ</i> deformation measurements

Ruyue Zhang; Yu Fu; Hong Miao

doi:10.3788/COL202422.011202

Chinese Optics Letters, Volume. 22, Issue 1, 011202(2024)

New speckle pattern interferometry for precise in situ deformation measurements

Ruyue Zhang¹, Yu Fu², and Hong Miao^1、*

¹CAS Key Laboratory of Mechanical Behavior and Design of Materials, Department of Modern Mechanics, University of Science and Technology of China, Hefei 230027, China

²Shenzhen Key Laboratory of Intelligent Optical Measurement and Detection, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China

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Cited By

[1] Zhaorui Xu, Jie Li, Rongsheng Ba, Liqun Chai, Lan Wu, Qiao Xu, Dong Liu.

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Ruyue Zhang, Yu Fu, Hong Miao. New speckle pattern interferometry for precise in situ deformation measurements[J]. Chinese Optics Letters, 2024, 22(1): 011202

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Paper Information

Category: Instrumentation, Measurement, and Optical Sensing

Received: Jul. 5, 2023

Accepted: Aug. 31, 2023

Published Online: Jan. 9, 2024

The Author Email: Hong Miao (miaohong@ustc.edu.cn)

DOI:10.3788/COL202422.011202

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology