Chinese Optics Letters, Volume. 22, Issue 1, 011202(2024)

New speckle pattern interferometry for precise in situ deformation measurements

Ruyue Zhang1, Yu Fu2, and Hong Miao1、*
Author Affiliations
  • 1CAS Key Laboratory of Mechanical Behavior and Design of Materials, Department of Modern Mechanics, University of Science and Technology of China, Hefei 230027, China
  • 2Shenzhen Key Laboratory of Intelligent Optical Measurement and Detection, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China
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    Figures & Tables(7)
    Optical layout of the proposed method.
    (a) Close-up view of the test object; (b) schematic diagram of the spatial arrangement of the LDVs; (c) plane view of the test object.
    (a) Interferograms before deformation and after deformation and (b) out-of-plane displacement caused by the vibrations recorded by the LDVs.
    Phase-shifted planes obtained by fitting the data measured by the LDVs at different times.
    (a) Deformation phase obtained by the four-step phase-shifting method; (b) deformation phase obtained by the proposed method; (c) calculation errors of these two methods; (d) data from the cross sections in panels (a)–(c).
    (a) 3D plot and (b) 2D plot at the deformation time t = 3 s; (c) errors of the static measurements and dynamic measurements.
    (a) Deformations at cross section L at different instants and (b) transient deformations of points A, B, and C.
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    Ruyue Zhang, Yu Fu, Hong Miao. New speckle pattern interferometry for precise in situ deformation measurements[J]. Chinese Optics Letters, 2024, 22(1): 011202

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    Paper Information

    Category: Instrumentation, Measurement, and Optical Sensing

    Received: Jul. 5, 2023

    Accepted: Aug. 31, 2023

    Published Online: Jan. 9, 2024

    The Author Email: Hong Miao (miaohong@ustc.edu.cn)

    DOI:10.3788/COL202422.011202

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