Acta Photonica Sinica, Volume. 46, Issue 9, 912008(2017)

Error Margin Analysis of Three-flat Test Based on Zernike Polynomials Fitting

GAO Fei1、*, LI Jin-hui1,2, TIAN Ai-ling3, LIU Bing-cai3, LI Shi-jie3, and YUE Xin3
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    Based on Zernike polynomials fitting, the measurement errors posed by optical axis deviation, rotation angle and active area on different types of high-precision surface were analyzed and the experimental verifications were conducted respectively. The results show that the measurement is not sensitive to the rotation angle and active area, the cost of calibrated rotation angle can therefore be reduced, while the impact of optical axis deviation on measurement precision is rather significant, which should be strictly adjusted before the test on high-precision surface.

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    GAO Fei, LI Jin-hui, TIAN Ai-ling, LIU Bing-cai, LI Shi-jie, YUE Xin. Error Margin Analysis of Three-flat Test Based on Zernike Polynomials Fitting[J]. Acta Photonica Sinica, 2017, 46(9): 912008

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    Paper Information

    Received: Mar. 28, 2017

    Accepted: --

    Published Online: Oct. 16, 2017

    The Author Email: Fei GAO (gfgf_861031@163.com)

    DOI:10.3788/gzxb20174609.0912008

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