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Optics and Precision Engineering, Volume. 24, Issue 1, 39(2016)

Photoelectric parameter measurement system for chip-on-board wafer level packaging LEDs

QIU Yan-qing1,*... ZHANG Liu-liu1, CHEN Miao-gen1 and WANG Cheng-qun2 |Show fewer author(s)
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    QIU Yan-qing, ZHANG Liu-liu, CHEN Miao-gen, WANG Cheng-qun. Photoelectric parameter measurement system for chip-on-board wafer level packaging LEDs[J]. Optics and Precision Engineering, 2016, 24(1): 39

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    Received: Aug. 14, 2015

    Accepted: --

    Published Online: Mar. 22, 2016

    The Author Email: Yan-qing QIU (qyqhz@cjlu.edu.cn)

    DOI:10.3788/ope.20162401.0039

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology