Chinese Journal of Quantum Electronics, Volume. 24, Issue 6, 714(2007)

Measurement of material surface's Mueller matrix by Fourier decomposition

Yun-zhi WU... Qing-nong WEI*, Shi-mei WANG and Wei-wei FENG |Show fewer author(s)
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    References(10)

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    [7] [7] Krishnan S. Mueller matrix ellipsometry using the division-of-amplitude photopolarimeter:a study of depolarization effects [J].Appl. Opt. A,1994,33: 4184-4192.

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    CLP Journals

    [1] Ding Chizhu, Yang Kecheng, Li Wei, Xia Min. Intensity Distribution of Polarized Light Scattering for a Nucleated Cell[J]. Acta Optica Sinica, 2013, 33(11): 1129001

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    WU Yun-zhi, WEI Qing-nong, WANG Shi-mei, FENG Wei-wei. Measurement of material surface's Mueller matrix by Fourier decomposition[J]. Chinese Journal of Quantum Electronics, 2007, 24(6): 714

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    Paper Information

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    Received: Jan. 15, 2007

    Accepted: --

    Published Online: Jun. 7, 2010

    The Author Email: Qing-nong WEI (qnwei@aiofm.ac.cn)

    DOI:

    CSTR:32186.14.

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