Chinese Journal of Quantum Electronics, Volume. 24, Issue 6, 714(2007)
Measurement of material surface's Mueller matrix by Fourier decomposition
Get Citation
Copy Citation Text
WU Yun-zhi, WEI Qing-nong, WANG Shi-mei, FENG Wei-wei. Measurement of material surface's Mueller matrix by Fourier decomposition[J]. Chinese Journal of Quantum Electronics, 2007, 24(6): 714
Category:
Received: Jan. 15, 2007
Accepted: --
Published Online: Jun. 7, 2010
The Author Email: Qing-nong WEI (qnwei@aiofm.ac.cn)
CSTR:32186.14.