High Power Laser Science and Engineering, Volume. 12, Issue 1, 010000e1(2024)

Specifications and control of spatial frequency errors of components in two-beam laser static holographic exposure for pulse compression grating fabrication

Chen Hu1,2,3, Songlin Wan1,2、*, Guochang Jiang1,2, Haojin Gu1,2, Yibin Zhang2, Yunxia Jin2, Shijie Liu1,2,3,5, Chengqiang Zhao2, Hongchao Cao2, Chaoyang Wei1,2,3、*, and Jianda Shao1,2,3,4,5、*
Author Affiliations
  • 1Precision Optical Manufacturing and Testing Center, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (CAS), Shanghai, China
  • 2Key Laboratory for High Power Laser Material of Chinese Academy of Sciences, Shanghai Institute of Optics and Fine Mechanics, CAS, Shanghai, China
  • 3Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China
  • 4Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou, China
  • 5China-Russian Belt and Road Joint Laboratory on Laser Science, Shanghai, China
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    Figures & Tables(11)
    Setup of two-beam interference lithography for MLD gratings. L, Kr+ laser; M, mirror; PM, piezo mirror; λ/2, polarization rotator (e.g., half-wave plate); PBS, polarizing beam splitter; SF, spatial filter; SH, shutter; OAP, off-axis parabolic mirror; S, substrate with mount; RG, reference grating; G, ground glass.
    Reflective two-beam laser static interference lithography station for MLD grating fabrication.
    Processing steps of manufacturing MLD grating.
    (a) Schematic diagram of the light field diffraction law in the exposure system. (b) Local figure error example with MSF and HSF errors. (c) Actual light field photo caused by the example surface. (d) Theoretical prediction result calculated by the proposed model. (e) Sine filter characteristic of the light field diffraction law.
    The frequency error division scheme for the grating exposure system.
    Surface shape error distribution of the off-axis parabolic mirror under the traditional polishing process. (a) The figure error of the off-axis mirror measured by using a 4" Zygo interferometer. (b) The MSF error filtered according to the model specification and a photo of the light field distribution. (c) The HSF error measured by a Zygo white light profiler with a 20 × lens and a photo of the microscale grating mask. (d) 1D-PSD curves.
    (a) MRF and “magic” angle step technology. (b) Small tool processing and smooth pseudorandom path.
    Surface shape error distribution of the off-axis parabolic mirror after the combined polishing process. (a) Using a 4" Zygo interferometer to measure the figure error of the off-axis mirror. (b) The MSF error filtered according to the model specification and a photo of the light field distribution; (c) The HSF error measured by a Zygo white light profiler with a 20 × lens and a photo of the microscale grating mask. (d) 1D-PSD curves.
    Diffraction wavefront and efficiency distribution of the MLD grating. (a) –1st order diffracted wavefront. (b) Zeroth order diffracted wavefront. (c) +1st order diffracted wavefront. (d) The diffraction efficiency map of the MLD grating at 1740 l/mm shows excellent uniformity of diffraction efficiency over the entire aperture for 1053 nm (Ave = 98.1%, σ = 0.3%, Max = 98.6%). (e) A 200 mm × 150 mm, 1740 l/mm MLD grating designed for use at 1053 nm, fabricated by reflective lithography.
    • Table 1. The OAP mirror optical design prescription.

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      Table 1. The OAP mirror optical design prescription.

      Optical parameterValueNote
      Mirror diameter300 mm
      MaterialGlass ceramics
      Vertex radius of3000 mm
      curvature
      Off-axis distance240 mmDistance from the
      parent vertex
      Conic constant–1Parabola
      Aspheric departure24 μmAstigmatic peak-to-valley
      departure
      Measurement methodNull test with
      standard plane mirror
    • Table 2. Exposure mirror specifications for the reflection exposure system.

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      Table 2. Exposure mirror specifications for the reflection exposure system.

      SpecificationSpatial frequency rangeIndex requirements
      LSF error $f<1/\sqrt{30\lambda z}$ PV < 60 nm[31]
      MSF error $1/\sqrt{30\lambda z}\le f<1.414/\sqrt{\lambda z}$ RMS < λ/640 (0.65 nm
      for λ = 413.1 nm)
      HSF error $1.414/\sqrt{\lambda z}\le f<1/\lambda$ RMS < λ/820 (0.5 nm
      for λ = 413.1 nm)
      OthersPSD curve of figure error has
      no peaks in either direction
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    Chen Hu, Songlin Wan, Guochang Jiang, Haojin Gu, Yibin Zhang, Yunxia Jin, Shijie Liu, Chengqiang Zhao, Hongchao Cao, Chaoyang Wei, Jianda Shao. Specifications and control of spatial frequency errors of components in two-beam laser static holographic exposure for pulse compression grating fabrication[J]. High Power Laser Science and Engineering, 2024, 12(1): 010000e1

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    Paper Information

    Category: Research Articles

    Received: Jun. 11, 2023

    Accepted: Sep. 22, 2023

    Posted: Sep. 25, 2023

    Published Online: Jan. 8, 2024

    The Author Email: Songlin Wan (songlin_wan@siom.ac.cn), Chaoyang Wei (siomwei@siom.ac.cn), Jianda Shao (jdshao@siom.ac.cn)

    DOI:10.1017/hpl.2023.81

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