Journal of Terahertz Science and Electronic Information Technology , Volume. 17, Issue 6, 1045(2019)
Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics
References(3)
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LIU Enbo, LI Zhishen, CHEN Qi, ZHANG Yu. Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics[J]. Journal of Terahertz Science and Electronic Information Technology , 2019, 17(6): 1045
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Received: Jan. 10, 2018
Accepted: --
Published Online: Feb. 24, 2020
The Author Email: Enbo LIU (liueb@grgtest.com)
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