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Journal of Terahertz Science and Electronic Information Technology , Volume. 17, Issue 6, 1045(2019)

Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics

LIU Enbo1,*... LI Zhishen2, CHEN Qi1 and ZHANG Yu1 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
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    LIU Enbo, LI Zhishen, CHEN Qi, ZHANG Yu. Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics[J]. Journal of Terahertz Science and Electronic Information Technology , 2019, 17(6): 1045

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    Received: Jan. 10, 2018

    Accepted: --

    Published Online: Feb. 24, 2020

    The Author Email: Enbo LIU (liueb@grgtest.com)

    DOI:10.11805/tkyda201906.1045

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology