Journal of Terahertz Science and Electronic Information Technology , Volume. 17, Issue 6, 1045(2019)
Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics
A simulation analysis method of harsh electromagnetic irradiation susceptibility about electronics is proposed aiming for high electromagnetic pulse attack in complex electromagnetic environment. This method combines 3D electromagnetic field simulation with 2D electric circuit simulation, which includes steps of building model, defining material parameters, adding load and exciting source, placing observation points. This method can obtain time-domain and frequency-domain characteristic of space and cable. According to the simulation results, the voltage and current in space and cable can reach peak soon with broad frequency domain, which are able to destroy many electronics. Therefore, some methods should be adopted to protect electronic devices. The proposed simulation method also can be utilized to analyze harsh electromagnetic irradiation susceptibility of all common electronics.
Get Citation
Copy Citation Text
LIU Enbo, LI Zhishen, CHEN Qi, ZHANG Yu. Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics[J]. Journal of Terahertz Science and Electronic Information Technology , 2019, 17(6): 1045
Category:
Received: Jan. 10, 2018
Accepted: --
Published Online: Feb. 24, 2020
The Author Email: Enbo LIU (liueb@grgtest.com)