Optics and Precision Engineering, Volume. 30, Issue 4, 372(2022)

Dual energy imaging inspection system using dual layer flat panel detector

Chongzhou LAN1... Zongpeng WANG1,* and Minru WEN2 |Show fewer author(s)
Author Affiliations
  • 1Shenzhen Angell Technology Co., Ltd., Shenzhen58000, China
  • 2School of Physics & Optoelectronic Engineering, Guangdong University of Technology, Guangzhou510006, China
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    Chongzhou LAN, Zongpeng WANG, Minru WEN. Dual energy imaging inspection system using dual layer flat panel detector[J]. Optics and Precision Engineering, 2022, 30(4): 372

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    Paper Information

    Category: Modern Applied Optics

    Received: Jul. 8, 2021

    Accepted: --

    Published Online: Mar. 4, 2022

    The Author Email: WANG Zongpeng (zongpeng39@gmail.com)

    DOI:10.37188/OPE.20223004.0372

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