Optics and Precision Engineering, Volume. 30, Issue 4, 372(2022)
Dual energy imaging inspection system using dual layer flat panel detector
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Chongzhou LAN, Zongpeng WANG, Minru WEN. Dual energy imaging inspection system using dual layer flat panel detector[J]. Optics and Precision Engineering, 2022, 30(4): 372
Category: Modern Applied Optics
Received: Jul. 8, 2021
Accepted: --
Published Online: Mar. 4, 2022
The Author Email: WANG Zongpeng (zongpeng39@gmail.com)