Optics and Precision Engineering, Volume. 30, Issue 4, 372(2022)

Dual energy imaging inspection system using dual layer flat panel detector

Chongzhou LAN1... Zongpeng WANG1,* and Minru WEN2 |Show fewer author(s)
Author Affiliations
  • 1Shenzhen Angell Technology Co., Ltd., Shenzhen58000, China
  • 2School of Physics & Optoelectronic Engineering, Guangdong University of Technology, Guangzhou510006, China
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    Figures & Tables(11)
    FPD structure
    Dual layer X-ray detection imaging system
    X-ray spectrum excited by different tube voltages
    X-ray spectrum excited by 120 kVp with different filter
    Dual energy imaging analysis of kVp switching
    Dual energy imaging analysis of dual layer FPD
    Dual energy images of resolution test card fused performance before and after registration
    Dual energy subtraction images performance
    • Table 1. Exposure conditions of kVp switching

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      Table 1. Exposure conditions of kVp switching

      图像类型管电压/kVp管电流/mA电荷量/mAs曝光时间/ms
      低能6032080250
      高能1203205.617.5
    • Table 2. Exposure conditions of dual layer detection

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      Table 2. Exposure conditions of dual layer detection

      管电压/kVp管电流/mA电荷量/mAs曝光时间/ms
      1203202062.5
    • Table 3. SDNR comparison of dual energy subtraction images

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      Table 3. SDNR comparison of dual energy subtraction images

      方式高能Elow低能Ehigh骨增强骨抑制
      kVp切换2.904.735.171.13
      双层平板3.404.976.800.06
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    Chongzhou LAN, Zongpeng WANG, Minru WEN. Dual energy imaging inspection system using dual layer flat panel detector[J]. Optics and Precision Engineering, 2022, 30(4): 372

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    Paper Information

    Category: Modern Applied Optics

    Received: Jul. 8, 2021

    Accepted: --

    Published Online: Mar. 4, 2022

    The Author Email: WANG Zongpeng (zongpeng39@gmail.com)

    DOI:10.37188/OPE.20223004.0372

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