Laser & Optoelectronics Progress, Volume. 57, Issue 5, 053001(2020)
Structure Analysis and Experiment of an Offner-Type Short-Wave Infrared Imaging Spectrometer
Fig. 1. Structural composition of an Offner imaging spectrometer
Fig. 2. Exploded view of the components
Fig. 3. Finite element model of imaging spectrometer
Fig. 4. Nature mode sharp of mechanical structure and optical elements. (a) Mechanical structure; (b) optical elements
Fig. 5. RMS values between mirrors at 0-40 ℃
Fig. 6. PV values between mirrors at 0-40 ℃
Fig. 7. RMS values between translating mirrors at 0-40 ℃
Fig. 8. RMS values between rotating mirrors at 0-40 ℃
Fig. 9. Random test condition
Fig. 10. Vibration test scene
Fig. 11. Optical detection before and after vibration test
Fig. 12. Thermo optical test scene
Fig. 13. Short-wave scanning pictures
Fig. 14. Spectral image and spectral curve at 20 ℃. (a) Spectral image; (b) spectral curve
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Zhizhong Zheng, Zhong Yang, Yuantian Qin, Liguo Wang. Structure Analysis and Experiment of an Offner-Type Short-Wave Infrared Imaging Spectrometer[J]. Laser & Optoelectronics Progress, 2020, 57(5): 053001
Category: Spectroscopy
Received: Aug. 5, 2019
Accepted: Aug. 27, 2019
Published Online: Mar. 5, 2020
The Author Email: Zheng Zhizhong (zhengzz_js@126.com)