Structure Analysis and Experiment of an Offner-Type Short-Wave Infrared Imaging Spectrometer

Zhizhong Zheng; Zhong Yang; Yuantian Qin; Liguo Wang

doi:10.3788/LOP57.053001

Laser & Optoelectronics Progress, Volume. 57, Issue 5, 053001(2020)

Structure Analysis and Experiment of an Offner-Type Short-Wave Infrared Imaging Spectrometer

Zhizhong Zheng^1,3、*, Zhong Yang¹, Yuantian Qin², and Liguo Wang²

Author Affiliations

¹College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 211100, China

²College of Aeronautics, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 210016, China

³Nanjing Geological Survey Center, China Geological Survey, Nanjing, Jiangsu 210016, China

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Zhizhong Zheng, Zhong Yang, Yuantian Qin, Liguo Wang. Structure Analysis and Experiment of an Offner-Type Short-Wave Infrared Imaging Spectrometer[J]. Laser & Optoelectronics Progress, 2020, 57(5): 053001

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Paper Information

Category: Spectroscopy

Received: Aug. 5, 2019

Accepted: Aug. 27, 2019

Published Online: Mar. 5, 2020

The Author Email: Zheng Zhizhong (zhengzz_js@126.com)

DOI:10.3788/LOP57.053001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology