Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures

Zhixin Liu; Meiling Jiang; Yanglin Hu; Feng Lin; Bo Shen; Xing Zhu; Zheyu Fang

doi:10.29026/oea.2018.180007

Opto-Electronic Advances, Volume. 1, Issue 4, 180007-1(2018)

Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures

Zhixin Liu... Meiling Jiang, Yanglin Hu, Feng Lin, Bo Shen, Xing Zhu and Zheyu Fang* |Show fewer author(s)

School of Physics, State Key Lab for Mesoscopic Physics, Academy for Advanced Interdisciplinary Studies, Collaborative Innovation Center of Quantum Matter, Peking University, Beijing 100871, China

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Zhixin Liu, Meiling Jiang, Yanglin Hu, Feng Lin, Bo Shen, Xing Zhu, Zheyu Fang. Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures[J]. Opto-Electronic Advances, 2018, 1(4): 180007-1

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Paper Information

Received: Apr. 17, 2018

Accepted: Jun. 24, 2018

Published Online: Mar. 19, 2019

The Author Email: Fang Zheyu (zhyfang@pku.edu.cn)

DOI:10.29026/oea.2018.180007

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

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