Opto-Electronic Advances, Volume. 1, Issue 4, 180007-1(2018)
Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures
Fig. 1. Schematic overview of a CL imaging spectrometer with spectral analysis function.Figure reproduced from ref. 11, CUP Publishing.
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Fig. 11. Measured carrier decay times
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Zhixin Liu, Meiling Jiang, Yanglin Hu, Feng Lin, Bo Shen, Xing Zhu, Zheyu Fang. Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures[J]. Opto-Electronic Advances, 2018, 1(4): 180007-1
Received: Apr. 17, 2018
Accepted: Jun. 24, 2018
Published Online: Mar. 19, 2019
The Author Email: Fang Zheyu (zhyfang@pku.edu.cn)