Infrared and Laser Engineering, Volume. 30, Issue 3, 226(2001)
Study on measuring system for minority carrier lifetime
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[3] [3] C NGUYEN VAN HUONG, Triboulet R, Lemasson P. Ag and Deposits on HgxTe (x=Cd,Zn) Alloys. J Cryst Growth, 1990, 101:311～317.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study on measuring system for minority carrier lifetime[J]. Infrared and Laser Engineering, 2001, 30(3): 226
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