Infrared and Laser Engineering, Volume. 30, Issue 3, 226(2001)

Study on measuring system for minority carrier lifetime

[in Chinese]*... [in Chinese], [in Chinese] and [in Chinese] |Show fewer author(s)
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study on measuring system for minority carrier lifetime[J]. Infrared and Laser Engineering, 2001, 30(3): 226

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    Received: Nov. 9, 2000

    Accepted: Dec. 23, 2000

    Published Online: Apr. 28, 2006

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