Spectroscopy and Spectral Analysis, Volume. 30, Issue 12, 3430(2010)
Study on the Damage of SiO2 Thin Films on LiNbO3 Crystal in Optical Parametric Oscillator by XRD Spectrometry
References(10)
[5] [5] Ramponi R, Marangoni M, Osellame R. Appl. Phys. Lett., 2001, 78(15): 2098.
[6] [6] Schirmer O F, Thiemann O, Wohlecke M. J. Phys. Chem. Solids, 1991, 52(1): 185.
[7] [7] Warren B E. X-ray Diffraction, Dover. New York, 1990.
[8] [8] Hopper R W, Uhlmann D R. Journal of Applied Physics, 1970, 41: 4023.
[9] [9] Glezer E N, Mazur E. Appl. Phys. Lett., 1997, 71: 882.
[10] [10] Walker T W, Guenther A H, Nielsen P E. IEEE Journal of Quantum Electronics, 1981, QE-17(10): 2053.
[12] [12] Feit M D, Rubenchik A M, Faux D R, et al. Proc. SPIE, 1997, 3047: 480.
[13] [13] Yoo J H, Jeong S H, Greif R, et al. Appl. Phys., 2000, 88: 1638.
[14] [14] Singh RK, Narayan J. Phys. Rev., 1990, B41(13): 8843.
[16] [16] Alberto Salleo. High-Power Laser Damage in Fused Silica. Dissertation for the Ph. D. of University of California, Berkeley, 2001. 105.
Tools
Get Citation
Copy Citation Text
NIU Rui-hua, HAN Jing-hua, LUO Jin, LU Feng, ZHU Qi-hua, LI Tong, YANG Li-ming, FENG Guo-ying, ZHOU Shou-huan. Study on the Damage of SiO2 Thin Films on LiNbO3 Crystal in Optical Parametric Oscillator by XRD Spectrometry[J]. Spectroscopy and Spectral Analysis, 2010, 30(12): 3430
Paper Information
Received: Mar. 8, 2010
Accepted: --
Published Online: Jan. 26, 2011
The Author Email: Rui-hua NIU (nrh_hjh@163.com)
CSTR:32186.14.
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20