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Spectroscopy and Spectral Analysis, Volume. 30, Issue 12, 3430(2010)

Study on the Damage of SiO2 Thin Films on LiNbO3 Crystal in Optical Parametric Oscillator by XRD Spectrometry

NIU Rui-hua1...2,*, HAN Jing-hua1, LUO Jin3, LU Feng1, ZHU Qi-hua3, LI Tong2, YANG Li-ming3, FENG Guo-ying1 and ZHOU Shou-huan1 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    NIU Rui-hua, HAN Jing-hua, LUO Jin, LU Feng, ZHU Qi-hua, LI Tong, YANG Li-ming, FENG Guo-ying, ZHOU Shou-huan. Study on the Damage of SiO2 Thin Films on LiNbO3 Crystal in Optical Parametric Oscillator by XRD Spectrometry[J]. Spectroscopy and Spectral Analysis, 2010, 30(12): 3430

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    Paper Information

    Received: Mar. 8, 2010

    Accepted: --

    Published Online: Jan. 26, 2011

    The Author Email: Rui-hua NIU (nrh_hjh@163.com)

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology