Chinese Journal of Quantum Electronics, Volume. 25, Issue 3, 346(2008)
Fractal surface of TiN thin films sputtered at different N2 flow ratios
[1] [1] Murarka S P. Multilevel interconnections for ULSI and GSI era [J].Mater. Sci. Eng.,1997,19: 87-15.
[2] [2] Kagiyama A,Terakado K,Urao R. Effect of nitride and TiN coating temperatures on the corrosion resistance of the combined surface modification layer [J].Surf. Coat. Technol.,2003,169-170: 397-400.
[3] [3] Wagner J,Mitter C,Penoy M. The Effect of Deposition Temperature on Microstructure and Properties of Thermal CVD TiN Coatings [J].Int. J. Refract Met Hard Mat,2008,26: 120-126.
[4] [4] Peery A J,Manory R R,Ward L P. The Effect of Metal Ion Post-implantation on the Near Surface Properties of TiN Deposited by CVD [J].Surf. Coat. Technol.,2000,16933-134: 203-207.
[5] [5] Takahashi T,Masugata K,et al. Surface Morphology of TiN Films Reactively Deposited by Bias Sputtering [J].Vacuum,2000,59:777-784.
[6] [6] Ge S,Suo S. The Computation Methods for Fractal Dimension of Surface Profils [J].Trans Tribol,1997,17(4):354-362.
[8] [8] Fromin A A,Akhmator V. Magnetron Sputtering System Stabilization for High Rate Deposition of AIN Films Vacuum [J].Vacuum,1998,49(3): 247-251.
[9] [9] Aita C R,Gawlak C J. The Dependence of Alumium Nitride Films Crystallography on Sputtering Plasma Composition [J].J. Vac. Sci. Technol.,1983,Al(2): 402-406.
[11] [11] Styervoyedov A,Farenik V. Formation of Ti and TiN Ultra-thin Films on Si by Ion Beam Sputter Deposition [J].Surf. Sci.,2006,600: 3766-3769.
Get Citation
Copy Citation Text
LUO Xiang-dong. Fractal surface of TiN thin films sputtered at different N2 flow ratios[J]. Chinese Journal of Quantum Electronics, 2008, 25(3): 346
Category:
Received: Nov. 19, 2007
Accepted: --
Published Online: Jun. 7, 2010
The Author Email: Xiang-dong LUO (lxd7973@163.com)
CSTR:32186.14.