Chinese Journal of Quantum Electronics, Volume. 25, Issue 3, 346(2008)
Fractal surface of TiN thin films sputtered at different N2 flow ratios
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LUO Xiang-dong. Fractal surface of TiN thin films sputtered at different N2 flow ratios[J]. Chinese Journal of Quantum Electronics, 2008, 25(3): 346
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Received: Nov. 19, 2007
Accepted: --
Published Online: Jun. 7, 2010
The Author Email: Xiang-dong LUO (lxd7973@163.com)
CSTR:32186.14.