Chinese Journal of Quantum Electronics, Volume. 25, Issue 3, 346(2008)

Fractal surface of TiN thin films sputtered at different N2 flow ratios

Xiang-dong LUO*
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    LUO Xiang-dong. Fractal surface of TiN thin films sputtered at different N2 flow ratios[J]. Chinese Journal of Quantum Electronics, 2008, 25(3): 346

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    Paper Information

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    Received: Nov. 19, 2007

    Accepted: --

    Published Online: Jun. 7, 2010

    The Author Email: Xiang-dong LUO (lxd7973@163.com)

    DOI:

    CSTR:32186.14.

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