Infrared and Laser Engineering, Volume. 47, Issue 11, 1105002(2018)

Reliability of bonding interface in high power diode lasers

Peng Bo1,2, Zhang Pu1, Chen Tianqi1,2, Zhao Yincen2, Wu Dihai1,2, and Liu Hui1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(10)

    [1] [1] Wang Yinshun, Ren Yongxue, An Zhenfeng. Study of high brightness fiber coupled diode lasers [J]. Infrared and Laser Engineering, 2016, 45(S2): S206004. (in Chinese)

    [2] [2] Wu D, Zhang P, Nie Z, et al. Optimization of microchannel cooler of high power diode laser array package [C]//SPIE, 2017, 100851: 100850I.

    [3] [3] He Guorong, Zheng Wanhua, Qu Hongwei. Influence of fusion interface on optical and thermal characteristics of vertical cavity lasers[J]. Infrared and Laser Engineering, 2007, 36(6): 798-801. (in Chinese)

    [4] [4] Zhang P, Liu X, Zhu Q, et al. Thermal characteristics of compact conduction-cooled high power diode laser array packages" [C]//SPIE, 2017, 10085: 100850A.

    [5] [5] Chang Ruiwu. Influence of cryogenic temperature and microstructure on fatigue failure of indium solder joint [D]. Maryland: Maryland University, 2008.

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    [7] [7] Zhang Guoshang. Research on the mechanical properties of 80Au/20Sn solder alloy[D]. Tianjin: Tianjin University, 2010. (in Chinese)

    [8] [8] Zhang Pengzhe. Research on process and mechanism of bonding using small nanosil ver paste at low temperature and pressure[D]. Harbin: Harbin Institute of Technology, 2016. (in Chinese)

    [9] [9] Paydar N H, Tong Y, Akay H U. A finite element study of factors affecting fatigue life of solder joints[J]. ASME Journal of Electronic Packaging, 1994, 116(2): 265-273.

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    [1] Wenwen Liu, Wei Su, Wenhao Luo, Jianke Li, Renhuai Liu. Vibration reliability of mid-infrared solid laser[J]. Infrared and Laser Engineering, 2021, 50(4): 20200242

    [2] Yeqi Zhang, Zhenfu Wang, Te Li, Lang Chen, Jiachen Zhang, Shunhua Wu, Jiachen Liu, Guowen Yang. Lifetime prediction method for high-power laser diodes under double-stress cross-step accelerated degradation test[J]. Infrared and Laser Engineering, 2023, 52(5): 20220592

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    Peng Bo, Zhang Pu, Chen Tianqi, Zhao Yincen, Wu Dihai, Liu Hui. Reliability of bonding interface in high power diode lasers[J]. Infrared and Laser Engineering, 2018, 47(11): 1105002

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    Paper Information

    Category: 激光器技术

    Received: Jun. 5, 2018

    Accepted: Jul. 3, 2018

    Published Online: Jan. 10, 2019

    The Author Email:

    DOI:10.3788/irla201847.1105002

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