Semiconductor Optoelectronics, Volume. 41, Issue 2, 287(2020)
Design of Automated Test System for Leakage Current between Electrodes of CCD Image Sensor
[1] [1] Wang Junbo. CCD Image Sensor Technology and Applicaitons[M]. Chengdu: Press of University of Electronic Science and Technol., 2004.
[2] [2] Lian Minlong, Wang Shitao. Research on the imaging performance of space low light level imaging system based on ICCD[J]. Spacecraft Recovery & Remote Sensing, 2007, 28(3): 6-10.
[3] [3] Zhou Liwei. Photoelectronic imaging: Towards the new century[J]. J. of Beijing Institute of Technol., 2002, 22(1): 1-12.
[4] [4] Bosiers J T, Peters I M, Draijer C, et al. Technical challenges and recent progress in CCD imagers[J]. Nuclear Instruments and Methods in Physics Research A, 2006, 565(1): 148-156.
[5] [5] Sopczak A, Aoulmit S, Bekhouche K, et al. Radiation hardness studies in a CCD with high speed column parallel readout[J]. J. Instrumentation, 2008, 5(5): 05007.
[6] [6] Wang Qingyou. CCD Application Technology[M]. Tianjin: Tianjin University Press, 2000.
[7] [7] Gu Zuyi, Tian Lilin, Fu Liwen. Semiconductor Physics[M]. Beijing: Electronic Industry Press, 1995.
Get Citation
Copy Citation Text
GUO Li, ZHOU Jianyong, HE Da, HE Changhai, YIN Jun, TANG Zunlie, YUAN Shishun. Design of Automated Test System for Leakage Current between Electrodes of CCD Image Sensor[J]. Semiconductor Optoelectronics, 2020, 41(2): 287
Category:
Received: Dec. 5, 2019
Accepted: --
Published Online: Jun. 17, 2020
The Author Email: