Semiconductor Optoelectronics, Volume. 41, Issue 2, 287(2020)
Design of Automated Test System for Leakage Current between Electrodes of CCD Image Sensor
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GUO Li, ZHOU Jianyong, HE Da, HE Changhai, YIN Jun, TANG Zunlie, YUAN Shishun. Design of Automated Test System for Leakage Current between Electrodes of CCD Image Sensor[J]. Semiconductor Optoelectronics, 2020, 41(2): 287
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Received: Dec. 5, 2019
Accepted: --
Published Online: Jun. 17, 2020
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