Semiconductor Optoelectronics, Volume. 41, Issue 2, 287(2020)

Design of Automated Test System for Leakage Current between Electrodes of CCD Image Sensor

GUO Li... ZHOU Jianyong, HE Da, HE Changhai, YIN Jun, TANG Zunlie and YUAN Shishun |Show fewer author(s)
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    Leakage current between electrodes of charge coupled device (CCD) image sensors is a key parameter affecting the reliability of CCD, thus the measurement of leakage current is very important for the detection and screening in the production process of CCD image sensors. In this paper, based on an automatic test method of leakage current, an automated test system for leakage current between CCD electrodes is designed. The signal name, test channel address and the test criterion can be customized according to different types of CCDs, and automated cycle scanning operations are controlled by computer software to collect leakage current data to form a standard test report automatically. This automated test system presents the advantages of flexible setting, convenient operation and automated testing, which can effectively improve the testing efficiency and equipment versatility in the production and screening processes of CCDs.

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    GUO Li, ZHOU Jianyong, HE Da, HE Changhai, YIN Jun, TANG Zunlie, YUAN Shishun. Design of Automated Test System for Leakage Current between Electrodes of CCD Image Sensor[J]. Semiconductor Optoelectronics, 2020, 41(2): 287

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    Paper Information

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    Received: Dec. 5, 2019

    Accepted: --

    Published Online: Jun. 17, 2020

    The Author Email:

    DOI:10.16818/j.issn1001-5868.2020.02.028

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