Acta Photonica Sinica, Volume. 49, Issue 3, 0322001(2020)

An X-ray Detection Technology with Multi-curvature Bent Crystal

Jun SHI1... Miao LI2, Lin-dong-ying LUO1, Feng WANG3, Guo-hong YANG3 and Min-xi WEI3 |Show fewer author(s)
Author Affiliations
  • 1Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China, Chongqing University, Chongqing 400044, China
  • 2College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China
  • 3Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, Sichuan 621900 China
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    References(12)

    [6] [6] SHEVELKO A P, ANTONOV AA, GRIGIEVA I G, et al. A focusing crystal von Hamos spectrometer f Xray spectroscopy Xray fluescence applications[C]. SPIE, 2000, 4144: 148154.

    [7] A P SHEVELKO, A A ANTONOV, I G GRIGORIEVA. X-ray focusing crystal von hamos spectrometer with a CCD linear array as a detector. Advances in X-ray Analysis, 45, 433-440(2002).

    [8] [8] SHEVELKO A P. Xray spectroscopy of laserproduced plasmas using a von Hamos spectrograph[C]. SPIE, 1998, 3406: 91108.

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    Jun SHI, Miao LI, Lin-dong-ying LUO, Feng WANG, Guo-hong YANG, Min-xi WEI. An X-ray Detection Technology with Multi-curvature Bent Crystal[J]. Acta Photonica Sinica, 2020, 49(3): 0322001

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    Paper Information

    Category: Optical Design and Fabrication

    Received: Oct. 11, 2019

    Accepted: Jan. 2, 2020

    Published Online: Apr. 24, 2020

    The Author Email:

    DOI:10.3788/gzxb20204903.0322001

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