Acta Photonica Sinica, Volume. 49, Issue 3, 0322001(2020)
An X-ray Detection Technology with Multi-curvature Bent Crystal
Fig. 1. Imaging structure of conical crystal spectrograph
Fig. 2. The formation of two cones
Fig. 3. Reflection of an X-ray from the multi-curvature bent crystal surface
Fig. 4. X-ray path in
Fig. 5. Schematic of the reflection point moving along negative
Fig. 6. Schematic of the source, bent crystal and detector
Fig. 7. X-ray spectrum obtained by CMOS camera
Fig. 8. Distribution of spectral intensity
Fig. 9. Image of image plate recording Ti target shot
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Jun SHI, Miao LI, Lin-dong-ying LUO, Feng WANG, Guo-hong YANG, Min-xi WEI. An X-ray Detection Technology with Multi-curvature Bent Crystal[J]. Acta Photonica Sinica, 2020, 49(3): 0322001
Category: Optical Design and Fabrication
Received: Oct. 11, 2019
Accepted: Jan. 2, 2020
Published Online: Apr. 24, 2020
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