Acta Photonica Sinica, Volume. 49, Issue 3, 0322001(2020)

An X-ray Detection Technology with Multi-curvature Bent Crystal

Jun SHI1, Miao LI2, Lin-dong-ying LUO1, Feng WANG3, Guo-hong YANG3, and Min-xi WEI3
Author Affiliations
  • 1Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China, Chongqing University, Chongqing 400044, China
  • 2College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China
  • 3Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, Sichuan 621900 China
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    Figures & Tables(9)
    Imaging structure of conical crystal spectrograph
    The formation of two cones
    Reflection of an X-ray from the multi-curvature bent crystal surface
    X-ray path in xoz plane with the reflection point offset of Δz
    Schematic of the reflection point moving along negative z axis
    Schematic of the source, bent crystal and detector
    X-ray spectrum obtained by CMOS camera
    Distribution of spectral intensity
    Image of image plate recording Ti target shot
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    Jun SHI, Miao LI, Lin-dong-ying LUO, Feng WANG, Guo-hong YANG, Min-xi WEI. An X-ray Detection Technology with Multi-curvature Bent Crystal[J]. Acta Photonica Sinica, 2020, 49(3): 0322001

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    Paper Information

    Category: Optical Design and Fabrication

    Received: Oct. 11, 2019

    Accepted: Jan. 2, 2020

    Published Online: Apr. 24, 2020

    The Author Email:

    DOI:10.3788/gzxb20204903.0322001

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