Electronics Optics & Control, Volume. 23, Issue 12, 90(2016)

Bayes Approach for Nonlinear Degradation Process Modeling of Inertial Device RUL Prediction

YANG Hao-tian... WANG Li-xin, TIAN Ying and TAN Ji-wen |Show fewer author(s)
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    References(5)

    [2] [2] WANG W B. A two-stage prognosis model in condition based maintenance[J]. European Journal of Operational Research, 2007, 182(3): 1177-1187.

    [3] [3] PECHT M, JAAI R. A prognostics and health management roadmap for information and electrics-rich system[J]. Micro-Electronics Reliability, 2010, 50(3): 317-323.

    [8] [8] ZHOU Q, SON J B, ZHOU S Y. Remaining useful life prediction of individual units subject to hard failure[J]. IIE Transaction, 2014, 46:1017-1030.

    [12] [12] GEBRAEEL N Z, LAWLEY M A, LI R, et al. Residual life distributions from component degradation signals: a Bayesian approach[J]. IEEE Transactions on Reliability, 2005, 37(6): 543-557.

    [14] [14] SI X S, WANG W B, HU C H, et al. Remaining useful life estimation based on a nonlinear diffusion degradation process[J]. IEEE Transactions on Reliability, 2012, 44(1): 50-67.

    CLP Journals

    [1] MA Jiashun, WU Jianfeng, XUE Xirui, LI Ning. A Life Prediction Method for Multi-source Data Fusion Modeling[J]. Electronics Optics & Control, 2021, 28(7): 88

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    YANG Hao-tian, WANG Li-xin, TIAN Ying, TAN Ji-wen. Bayes Approach for Nonlinear Degradation Process Modeling of Inertial Device RUL Prediction[J]. Electronics Optics & Control, 2016, 23(12): 90

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    Paper Information

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    Received: Oct. 14, 2015

    Accepted: --

    Published Online: Jan. 25, 2021

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2016.12.020

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