Electronics Optics & Control, Volume. 23, Issue 12, 90(2016)
Bayes Approach for Nonlinear Degradation Process Modeling of Inertial Device RUL Prediction
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YANG Hao-tian, WANG Li-xin, TIAN Ying, TAN Ji-wen. Bayes Approach for Nonlinear Degradation Process Modeling of Inertial Device RUL Prediction[J]. Electronics Optics & Control, 2016, 23(12): 90
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Received: Oct. 14, 2015
Accepted: --
Published Online: Jan. 25, 2021
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