Electronics Optics & Control, Volume. 21, Issue 9, 104(2014)

Reliability Assessment for a Certain Type of Electrical Connector Based on StepStress Accelerated Degradation Test

WANG Haowei1... XU Tingxue2 and ZHANG Xin2 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
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    References(12)

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    [2] [2] XIA X T.Forecasting method for product reliability along with performance data[J].Journal of Failure Analysis and Prevention201212(5):532-540.

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    [7] [7] WANG X LCHENG Z JGUO B.Residual life forecasting of metalized film capacitor based on Wiener process [J].Journal of National University of Defense Technology,201133(4):146-151.

    [8] [8] LIN S DPAN JCHEN W Het al.An introductory review on reliability research of electrical connectors [J].ElectroMechanical Components200929(4):52-56.

    [9] [9] YANG F W.Talk about innovation and development of military electrical connectors[J].Electromechanical Components201232(4):52-61.

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    CLP Journals

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    WANG Haowei, XU Tingxue, ZHANG Xin. Reliability Assessment for a Certain Type of Electrical Connector Based on StepStress Accelerated Degradation Test[J]. Electronics Optics & Control, 2014, 21(9): 104

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    Paper Information

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    Received: Oct. 22, 2013

    Accepted: --

    Published Online: Sep. 15, 2014

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2014.09.023

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