Electronics Optics & Control, Volume. 21, Issue 9, 104(2014)

Reliability Assessment for a Certain Type of Electrical Connector Based on StepStress Accelerated Degradation Test

WANG Haowei1... XU Tingxue2 and ZHANG Xin2 |Show fewer author(s)
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    WANG Haowei, XU Tingxue, ZHANG Xin. Reliability Assessment for a Certain Type of Electrical Connector Based on StepStress Accelerated Degradation Test[J]. Electronics Optics & Control, 2014, 21(9): 104

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    Paper Information

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    Received: Oct. 22, 2013

    Accepted: --

    Published Online: Sep. 15, 2014

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2014.09.023

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