Opto-Electronic Engineering, Volume. 51, Issue 7, 240078(2024)
Color space focusing evaluation algorithm for color overlay microscopy
[1] Z J Zhang, X Xu, J X Wang et al. Review of the development of light sheet fluorescence microscopy. Opto-Electron Eng, 50, 220045(2023).
[2] S Li, B W Wang, H T Guan et al. Far-field computational optical imaging techniques based on synthetic aperture: a review. Opto-Electron Eng, 50, 230090(2023).
[3] P Zhang, J M Wu, J Y Lin et al. Extended depth of field in microscopy. J Appl Opt, 35, 1075-1082(2014).
[4] W Wang, L H Zhang, T W Fu. Wavefront coding-based short-wave infrared imaging system for extended depth of field. Laser Optoelectron Prog, 60, 1011005(2023).
[5] J Hu, Z Y Tang, X Lan et al. Switchable edge detection and imaging based on a phase-change metasurface with Ge2Sb2Se4Te1. Opto-Electron Eng, 50, 220284(2023).
[6] T Seyler, M Fratz, T Beckmann et al. Extending the depth of field beyond geometrical imaging limitations using phase noise as a focus measure in multiwavelength digital holography. Appl Sci, 8, 1042(2018).
[7] C S Yu, R S Lu. Performance evaluation method for focusing evaluation operator in superposed large depth imaging. Laser Optoelectron Prog, 59, 1415027(2022).
[8] U Ali, M T Mahmood. Energy minimization for image focus volume in shape from focus. Pattern Recognit, 126, 108559(2022).
[9] X Liang, L B Qing, X T Yao et al. A dynamic step-size focusing algorithm based on intermediate frequency filtering. Intell Comput Appl, 12, 35-40(2022).
[10] R Xiong, N T Gu, H Y Xu. An auto-focusing evaluation function adapted to multi-directional gray gradient change. Laser Optoelectron Prog, 59, 0418001(2022).
[11] M N Lv, Z M Yu. Automatic focusing algorithm based on DCT coefficient of zero and local standard deviation. Laser Technol, 42, 66-71(2018).
[12] M T Mahmood. Cross-scale focus measure aggregation in depth recovery of microscopic objects. Microsc Res Tech, 82, 872-877(2019).
[13] S O Shim. Multidirectional focus measure for accurate three-dimensional shape recovery of microscopic objects. Microsc Res Tech, 85, 940-947(2022).
[14] S Pertuz, D Puig, M A Garcia. Analysis of focus measure operators for shape-from-focus. Pattern Recognit, 46, 1415-1432(2013).
[15] H S Jang, G Yun, H Mutahira et al. A new focus measure operator for enhancing image focus in 3D shape recovery. Microsc Res Tech, 84, 2483-2493(2021).
[16] Z Cao, Y Chao, W Xu et al. High-precision focusing method for parts image based on improved gradient weighting. J Electron Meas Instrum, 37, 132-142(2023).
[17] X F Wang, X W Sun, J K Wang et al. Focus measure operator combining cosine transform and Laplacian operator. Laser Optoelectron Prog, 58, 2410005(2021).
[18] Z Zhang, Y Liu, Z H Xiong et al. Focus and blurriness measure using reorganized DCT coefficients for an autofocus application. IEEE Trans Circuits Syst Video Technol, 28, 15-30(2018).
[19] B Liu, Q Qiao, J Zhao et al. 3D profile measurement based on depth from focus method using high-frequency component variance weighted entropy image sharpness evaluation function. Infrared Laser Eng, 50, 20200326(2021).
[20] Y P Zhai, D X Zhou, Y H Liu et al. Design of evaluation index for auto-focusing function and optimal function selection. Acta Opt Sin, 31, 0418002(2011).
[21] H Mutahira, B Ahmad, M S Muhammad et al. Focus measurement in color space for shape from focus systems. IEEE Access, 9, 103291-103310(2021).
[22] H Chatoux, N Richard, F Lecellier et al. Gradient in spectral and color images: from the Di Zenzo initial construction to a generic proposition. J Opt Soc Am A, 36, C154-C165(2019).
[23] Zenzo S Di. A note on the gradient of a multi-image. Comput Vision Graphics Image Process, 33, 116-125(1986).
[24] A Koschan, M Abidi. Detection and classification of edges in color images. IEEE Signal Process Mag, 22, 64-73(2005).
[27] Y L Zhang, L N Ji, F B Yang et al. Characterization of dual-mode infrared images fusion based on cosine similarity. Opto-Electron Eng, 46, 190059(2019).
[28] Y Li, X Y Li, J Q Wang et al. Multi-focus image fusion for microscopic depth-of-field extension of waterjet-assisted laser processing. Int J Adv Manuf Technol, 131, 1717-1734(2024).
Get Citation
Copy Citation Text
Yanqiong Shi, Yonghui Yang, Zhao Zha, Guang Zhu, Yu Zheng. Color space focusing evaluation algorithm for color overlay microscopy[J]. Opto-Electronic Engineering, 2024, 51(7): 240078
Category: Article
Received: Mar. 29, 2024
Accepted: Jun. 19, 2024
Published Online: Nov. 12, 2024
The Author Email: Yang Yonghui (杨永辉)