Opto-Electronic Engineering, Volume. 51, Issue 7, 240078(2024)
Color space focusing evaluation algorithm for color overlay microscopy
Fig. 5. Normalized focused evaluation curve for simulation images. (a) Table pixel focusing evaluation curve; (b) Boxes pixel focus evaluation curve; (c) Sideboard pixel focus evaluation curve
Fig. 7. Normalized focusing evaluation curve of noisy simulation images. (a) Table pixel focusing evaluation curve; (b) Boxes pixel focus evaluation curve; (c) Sideboard pixel focus evaluation curve
Fig. 8. Comparison between all-in-focus reference image and stacked focal fusion image. (a) Reference image; (b) Proposed fusion image; (c) SML fusion image; (d) Tenengrad fusion image; (e) GLV fusion image; (f) DCT fusion image; (g) SWAV fusion image; (h) Bre4d_var fusion image; (i) FMC fusion image
Fig. 9. Microscopic image acquisition. (a) Digital microscopy system; (b) Wafer samples; (c) Chip samples
Fig. 11. Normalized focusing evaluation curve of microscopic images. (a) Pixel focusing evaluation curve of wafer surface; (b) Chip bonding wire pixel focusing evaluation curve
Fig. 12. Chip bonding wire overlay fusion image. (a) Proposed; (b) SML; (c) Tenengrad;(d) GLV; (e) DCT; (f) SWAV; (g) Bre4d_var; (h) FMC
Fig. 13. Wafer surface overlay fusion image. (a) Proposed; (b) SML; (c) Tenengrad; (d) GLV; (e) DCT; (f) SWAV; (g) Bre4d_var; (h) FMC
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Yanqiong Shi, Yonghui Yang, Zhao Zha, Guang Zhu, Yu Zheng. Color space focusing evaluation algorithm for color overlay microscopy[J]. Opto-Electronic Engineering, 2024, 51(7): 240078
Category: Article
Received: Mar. 29, 2024
Accepted: Jun. 19, 2024
Published Online: Nov. 12, 2024
The Author Email: Yang Yonghui (杨永辉)