Acta Optica Sinica, Volume. 43, Issue 10, 1025002(2023)
Detection Probability Model and Verification of an Improved Single-Photon Avalanche Diode
Fig. 1. Schematic diagram of three-dimensional structure of P+/N well/deep N well SPAD device
Fig. 2. Movement process of photogenerated electron-hole pair
Fig. 3. Realization process of PDP modeling
Fig. 4. Simulated 2D electric field distribution of P+/N-well/deep N-well SPAD under 1 V overbias
Fig. 5. Electric field distribution obtained by Sentaurus Sdevice simulation under 1 V overbias
Fig. 6. Avalanche triggering probabilities of electron and hole at depletion region location
Fig. 7. Transmission spectrum of silica film
Fig. 8. PDP contributed by neutral region (P), neutral region (N), and depletion region
Fig. 9. Simulation results of PDP
Fig. 10. Simulated and measured PDP under 0.5 V overbias
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Zhixiang Cao, Meiling Zeng, Jian Yang, Xiangliang Jin. Detection Probability Model and Verification of an Improved Single-Photon Avalanche Diode[J]. Acta Optica Sinica, 2023, 43(10): 1025002
Category: OPTOELECTRONICS
Received: Dec. 7, 2022
Accepted: Dec. 27, 2022
Published Online: May. 10, 2023
The Author Email: Jin Xiangliang (jinxl@hunnu.edu.cn)