Acta Optica Sinica, Volume. 43, Issue 10, 1025002(2023)

Detection Probability Model and Verification of an Improved Single-Photon Avalanche Diode

Zhixiang Cao, Meiling Zeng, Jian Yang, and Xiangliang Jin*
Author Affiliations
  • School of Physics and Electronics, Hunan Normal University, Changsha 410081, Hunan , China
  • show less
    Figures & Tables(10)
    Schematic diagram of three-dimensional structure of P+/N well/deep N well SPAD device
    Movement process of photogenerated electron-hole pair
    Realization process of PDP modeling
    Simulated 2D electric field distribution of P+/N-well/deep N-well SPAD under 1 V overbias
    Electric field distribution obtained by Sentaurus Sdevice simulation under 1 V overbias
    Avalanche triggering probabilities of electron and hole at depletion region location x. (a) Avalanche triggering probability of electron; (b) avalanche triggering probability of hole; (c) total avalanche triggering probability of electron or hole
    Transmission spectrum of silica film
    PDP contributed by neutral region (P), neutral region (N), and depletion region
    Simulation results of PDP
    Simulated and measured PDP under 0.5 V overbias
    Tools

    Get Citation

    Copy Citation Text

    Zhixiang Cao, Meiling Zeng, Jian Yang, Xiangliang Jin. Detection Probability Model and Verification of an Improved Single-Photon Avalanche Diode[J]. Acta Optica Sinica, 2023, 43(10): 1025002

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: OPTOELECTRONICS

    Received: Dec. 7, 2022

    Accepted: Dec. 27, 2022

    Published Online: May. 10, 2023

    The Author Email: Jin Xiangliang (jinxl@hunnu.edu.cn)

    DOI:10.3788/AOS222111

    Topics