Journal of Applied Optics, Volume. 43, Issue 6, 1175(2022)

Effect of defects in ion barrier film on field of view of image intensifier

Ziheng HAO1...2, Chao SUN1,2, Yang LI1,2, Kaili YANG1,2, Ni ZHANG1,2, Yufeng ZHU1,2,*, Pengbo LI1,2, and Wanpeng YIN12 |Show fewer author(s)
Author Affiliations
  • 1Science and Technology on Low-Light-Level Night Vision Laboratory, Xi'an 710065, China
  • 2Kunming Institute of Physics, Kunming 650223, China
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    References(3)

    [1] [1] XIANG Shiming, NI Guoqiang. The principle of photoelectronic imaging devices[M]. Beijng: National Defense Indusrtry Press, 2006: 270-282.

    [7] [7] ZHANG Fu, RONG Limei, YUAN Zhiguang, et al. Characterization of densification for SiO2 film[J]. Microelectronics, 2011, 41(5): 459-462.

    [14] [14] FELDMAN L C, MAYER J W. Fundamentals of surface and thin film analysis [M]. Amsterdam: Elsevier, 1986: 236-238.

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    Ziheng HAO, Chao SUN, Yang LI, Kaili YANG, Ni ZHANG, Yufeng ZHU, Pengbo LI, Wanpeng YIN. Effect of defects in ion barrier film on field of view of image intensifier[J]. Journal of Applied Optics, 2022, 43(6): 1175

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    Paper Information

    Category: Research Articles

    Received: Aug. 8, 2022

    Accepted: --

    Published Online: Nov. 18, 2022

    The Author Email:

    DOI:10.5768/JAO202243.0604018

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