Journal of Applied Optics, Volume. 44, Issue 4, 868(2023)

Spectral transmittance calibration technology of infrared optical system

Siwei LI*... Xuexin WANG, Yi XIE, Yu GUO, Xiaoyu YAN, Yuxin YANG and Xu ZHANG |Show fewer author(s)
Author Affiliations
  • The First Scale Optical Metrology Station of the Science, Technology and Industry for National Defense, Xi'an Institute of Applied Optics, Xi'an 710065, China
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    References(6)

    [6] [6] General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China. Optical Instruments Vocabulary: GB/T 13962—2009[S]. Beijing: Standards Press of China, 2010: 70.

    [9] [9] YANG Hong, ZHAO Baozhen. The measurement of the transmittance for IR optical systems[C]//The Ninth National Symposium on Optical Testing. Xiamen: Optical Testing Committee of Chinese Optical Society, 2001: 61-64.

    [11] [11] WU Jinguang. Modern Fourier transform infrared spectroscopy technology and its application[M]. Beijing: Scientific and Technical Documents Publishing House, 1994: 251-301.

    [12] [12] BELL R J. Fourier transform spectroscopy[M]//Introductory Fourier transform spectroscopy. Amsterdam: Elsevier, 1972: 1-15.

    [13] [13] International Standardization Organization. Guide to the expression of uncertainty in measurement: JCGM 100: 2008[S]. Switzerland: [s. n. ], 1993: 37-38.

    [14] [14] General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China. Evaluation and Expression of Uncertainty in Measurement: JJF1059.1-2012[S]. Beijing: Standards Press of China, 2012: 18-23.

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    Siwei LI, Xuexin WANG, Yi XIE, Yu GUO, Xiaoyu YAN, Yuxin YANG, Xu ZHANG. Spectral transmittance calibration technology of infrared optical system[J]. Journal of Applied Optics, 2023, 44(4): 868

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    Paper Information

    Category: Research Articles

    Received: May. 26, 2022

    Accepted: --

    Published Online: Aug. 10, 2023

    The Author Email: LI Siwei (179034675@qq.com)

    DOI:10.5768/JAO202344.0403008

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