Journal of Applied Optics, Volume. 42, Issue 5, 839(2021)
Method of microscopic imaging quality evaluation for board lens based on image parameter extraction of pinhole imaging
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Bo LI, Fang WANG, Haowen LYU, Wei WU, Hangxin WEI. Method of microscopic imaging quality evaluation for board lens based on image parameter extraction of pinhole imaging[J]. Journal of Applied Optics, 2021, 42(5): 839
Category: OE INFORMATION ACQUISITION AND PROCESSING
Received: Jan. 21, 2021
Accepted: --
Published Online: Oct. 26, 2021
The Author Email: WU Wei (wuwei@xsyu.edu.cn)